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Heene, M., Hilbert, S., Draxler, C., Ziegler, M., & Bühner, M. (2011). Masking misfit in confirmatory factor analysis by increasing unique variances: A cautionary note on the usefulness of cutoff values of fit indices. Psychological Methods, 16(3), 319-336. https:// doi. org/ 10. 1037/ a0024 917
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Heene, M., Hilbert, S., Draxler, C., Ziegler, M., & Bühner, M. (2011). Masking misfit in confirmatory factor analysis by increasing unique variances: A cautionary note on the usefulness of cutoff values of fit indices. Psychological Methods, 16(3), 319-336. https://doi.org/10.1037/a0024917
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Heene, M., Hilbert, S., Draxler, C., Ziegler, M., Bühner, M. (2011). Masking misfit in confirmatory factor analysis by increasing unique variances: A cautionary note on the usefulness of cutoff values of fit indices. Psychological Methods, 16(3), pp. 319-336.
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