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  • Hosmer, David W., und Stanley Lemeshow. 2000. Applied Logistic Regression. 2. Aufl. Wiley series in probability and statistics. Texts and references sec- tion. New York: Wiley. http://www.worldcat. org/oclc/43929859. (xsd:string)
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  • Hosmer, D. W., Lemeshow, S. (2000). Applied Logistic Regression. 2. Aufl. Wiley series in probability and statistics. Texts and references sec- tion. New York: Wiley. (xsd:string)
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