reference_gesis-ssoar-21072_gesis-bib-101149_outcite
at
GESISKG
https://data.gesis.org/gesiskg/resource/reference_gesis-ssoar-21072_gesis-bib-101149_outcite
Property
Value
?:
linkContext
DA WES R. M. Fundamentals of attitude measurement. New York: Wiley, 1972 (dt. : Grundlagen der Einstellungsmessung. Weinheim: Beltz, 19 78).
(xsd:string)
?:
linkSource
OUTCITE pipeline
(xsd:string)
?:
linkingMethod
automatic
(xsd:string)
?:
mainEntity
<
https://data.gesis.org/gesiskg/resource/gesis-bib-101149
>
?:
name
M, D. A. W. (1972). Fundamentals of attitude measurement. New York: Wiley.
(xsd:string)
is
?:
referenceMetadata
of
<
https://data.gesis.org/gesiskg/resource/reference_gesis-ssoar-21072_gesis-bib-101149
>
?:
toSource
gesis_bib
(xsd:string)
rdf:
type
<
https://data.gesis.org/gesiskg/schema/LinkMetadata
>