gris-publication-7tui35ui4tk0

Property	Value
?:contributor	<https://data.gesis.org/gesiskg/resource/gris-publication-7tui35ui4tk0_James_Rounds> <https://data.gesis.org/gesiskg/resource/gris-publication-7tui35ui4tk0_Lena_Roemer> <https://data.gesis.org/gesiskg/resource/gris-publication-7tui35ui4tk0_Phil_Lewis>
?:dateModified	2023 (xsd:gyear)
?:datePublished	2023 (xsd:gyear)
?:doi	2698-1866/a000048 ()
?:duplicate	<https://data.gesis.org/gesiskg/resource/duplicate_gris-publication-7tui35ui4tk0_gesis-ssoar-87771>
is ?:hasPart of	<https://data.gesis.org/gesiskg/resource/>
is ?:mainEntity of	<https://data.gesis.org/gesiskg/resource/duplicate_gesis-ssoar-87771_gris-publication-7tui35ui4tk0>
?:name	The German O*NET Interest Profiler short form (xsd:string)
?:publicationType	article (xsd:string)
?:sourceInfo	GESIS-GRIS (xsd:string) In Psychological Test Adaptation and Development, 1(4), 156-167, 2023 (xsd:string)
rdf:type	<https://schema.org/ScholarlyArticle>