PropertyValue
?:about
?:author
?:contributor
?:duplicate
?:hasFulltext
  • true (xsd:boolean)
is ?:hasPart of
?:inLanguage
  • Englisch (EN) (xsd:string)
?:libraryLocation
is ?:mainEntity of
?:name
  • How low can you go? : an investigation of influence of sample size and model complexity on point and (xsd:string)
?:provider
?:publicationType
  • Buch (de)
  • Elektronische Ressource (xsd:string)
  • books (en)
?:sourceInfo
  • GESIS-BIB (xsd:string)
  • In: Methodology, vol. 10(2014) no. 1 ; p. 1-11 (xsd:string)
rdf:type